• Bandgap measurement of high refractive index materials by off-axis EELS 

      Vatanparast, Maryam; Egoavil, Ricardo; Reenaas, Turid Worren; verbeeck, Johan; Holmestad, Randi; Vullum, Per Erik (Journal article; Peer reviewed, 2017)
      In the present work Cs aberration corrected and monochromated scanning transmission electron microscopy electron energy loss spectroscopy (STEM-EELS) has been used to explore experimental set-ups that allow bandgaps of ...